PhD Sub Nanosecond Imaging of Operating Microelectronic Devices by X-ray Diffraction Microscopy - Grenoble

Réservé aux membres inscrits Grenoble, France

il y a 3 semaines

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Job summary

The successful candidate will join the team and collaborate with a network of European semiconductor device research groups and technology organizations.


The project addresses key challenges limiting efficiency and life-time of microelectronic and optoelectronic devices based on SiGe(Sn) heterostructures, namely heat generation and strain-induced degradation during operation.


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